Synthesis of SEU-tolerant ASICs using concurrent error correction

We present a new design technique for the concurrent error correction of single event upsets in the memory elements of ASICs. The technique uses a single error correction/double error detection (SEC/DED) Hamming code to encode the content of the memory elements. The area and delay overhead and error-correction capability are optimized by partitioning the set of memory elements. Design experiments show our technique is feasible, and it can be applied to any ASIC technology.