Random pattern fault simulation in multi-valued circuits

We present a fault simulator for Multi-Valued Logic Networks (MVLN). With this tool we investigate their Random Pattern Testability (RPT). We show for a restricted class of multi-valued circuits that the RPT is better than for two-valued circuits. We point out the relation between redundancies in two- and multi-valued logic networks. Moreover we show that the role of fault simulation for MVLNs is more important than in the binary case. A set of experimental results for large circuits emphasizes the efficiency of our approach.