Transformed pseudo-random patterns for BIST

This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into a new set of patterns that provides the desired fault coverage. The transformation is performed by a small amount of mapping logic that decodes sets of patterns that don't detect any new faults and maps them into patterns that detect the hard-to-detect faults. The mapping logic is purely combinational and is placed between the pseudo-random pattern generator and the circuit under test (CUT). A procedure for designing the mapping logic so that it satisfies test length and fault coverage requirements is described. Results are shown for benchmark circuits which indicate that an LFSR plus a small amount of mapping logic reduces the test length required for a particular fault coverage by orders of magnitude compared with using an LFSR alone. These results are compared with previously published results for other methods, and it is shown that the proposed method requires much less overhead to achieve the same fault coverage for the same test length.