Test pattern generation for I/sub DDQ/: increasing test quality

So far, the test pattern generation for I/sub DDQ/ testing has been performed without considering the value of the faulty current in comparison with the minimum current that is detectable as a fault: this approach will be shown to be misleading, since it actually gives optimistic coverage evaluation. Then, this work presents an ATPG strategy that targets the highest valves of current during the fault activation, in such a way that either a higher fault coverage can be obtained or a less accurate sensor can be used.