Self-test in a VCM driver chip

This paper describes a cost effective self-test mode in a complex mixed-signal device. The device under test (DUT) is a Voice-Coil Motor (VCM) H-bridge amplifier with an onchip 11-bit D/A converter. The self-test mode can be initiated at the chip, board and system levels of testing and troubleshooting. The added self-test circuitry does not induce any noticeable silicon overhead.