ADC transfer function analysis by means of a mixed wavelet-Walsh transform

Walsh transforms have recently been applied to the evaluation of analog to digital converters. In the present work, we compare the Walsh transform method with a method based on a wavelet transform, and propose that the new method be used as a complement to the previous one in order to improve global testing performance. The set of wavelets used is the Haar system, which constitutes an orthonormal base for real functions. The Haar system is applied to define the error map and the G operators ("generalized energy"), proposed by the authors as ADC testing indexes.