Photons counting of a 2D silicon /spl mu/-strip detector in high X-rays flux environment: double coincidences recovery

The double coincidence probability is a well known limitation to the rate capability of a 2-D detector with independent X- and Y-readout. The authors have implemented a parametric Monte Carlo simulation which could help in optimizing the double coincidence recovery. They have applied the parametric simulation to a specific 2-D solid state detector, they are developing for application in digital mammography.