Built-in self test architectures for multistage interconnection networks

A novel built-in self test architecture for locally controlled cube-type N/spl times/N multistage interconnection networks (MINs) is presented. First, a state-based pseudoexhaustive test procedure for this class of MINs is outlined. Then, a labelling algorithm on a binary n-cube is described which generates the necessary inputs for the tests. From the dependence graph of this algorithm a tree architecture is derived which results in a hardware overhead of O(1/log N).