Control of magnetic anisotropy for helical scan thin film heads

New Silicon Integrated Heads have been developed for helical scan recording. The control of the magnetic domain configuration is achieved by the head structure itself and the applied magnetic field during the NiFe electrodeposition. Thus the mean permeability is increased and the head sensitivity is greatly improved. The wear behavior of a silicon head has also been investigated. A wear rate less than 1 /spl mu/m/100 h can easily be achieved.