A study of autocorrelation function of 1/f current fluctuations in vacuum microelectronic devices

An analysis has been done of the autocorrelation function properties for processes with power spectral density of fluctuations S(f)/spl sim/1/f/sup /spl gamma// in a limited frequency range. A calculation technique is proposed to determine the spectral density function index /spl gamma/, the said technique using the autocorrelation function. The results of /spl gamma/ calculations agree well with the data of experimental measurements of low-frequency current fluctuations of the p-type Si field emitter.