Radiation evaluation of the 80C186 16-bit microprocessor utilizing an in-circuit emulator for in-situ electrical biasing and characterization

Radiation characterization data for the 80C186 16-bit microprocessor for two manufacturers are presented. An approach using an in-circuit emulator (ICE) to implement in-situ dynamic biasing and functional testing was used. Test results showed parametric failure levels that differ by more than a factor of 10 between devices from two manufacturers. Accelerated annealing measurements show that the Intel microprocessor does not anneal significantly until the annealing temperature is elevated to 150/spl deg/C while the Advanced Micro Devices (AMD) device exhibits more rapid annealing characteristics. Implications for space application and hardness assurance are discussed.