Techniques for accelerated measurement of low bit error rates in computer data links

We present techniques for the rapid estimation of very low (10/sup -12/ to 10/sup -20/) bit-error-rate (BER) in electrical and optical digital data links. Approximately 2 minutes elapsed time is required to perform a low BER test, independent of the actual BER value being measured. There are two types of applications: (1) confirming very low BER (<10/sup -12/) performance, and (2) reducing the time required to measure normal (10/sup -9/ to 10/sup -12/) BER values. These techniques are valid in the presence of BER floors.<
>