Correlation between I/sub DDQ/ testing quality and sensor accuracy

In existing approaches to I/sub DDQ/ fault simulation, the lack of estimate of the faulty current values in comparison with the instrumentation sensitivity prevents realistic assessments of testing quality. This paper fills the gap, presenting a method to estimate the faulty current considering the device conductances as well as the bridging resistance, and computing the fault coverage as a function of the sensor accuracy. Such information helps in the design of current monitoring equipments.<
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