Evaluation and alleviation of SOI impacts on SRAM functionality and yield

Super fast Monte-Carlo techniques are applied to allow deeper insight to the yield of SOI domino circuit design techniques for SRAMs. For the first time, Read-before-Write in dual supply domino bit-select design is analyzed in the presence of floating body effects, hysteretic and process variations. The methodology provides greater ability to alleviate non-functionality by identifying yield-optimized operating ranges.