Quick inspection of power-plane short fault on multilayer substrate

A quick inspection approach for finding the powerplane short fault on multichip modules is proposed in this paper. The current source is applied on two diagonal corners of the power plane. The location of the short fault can be determined by as few as four voltage measurements. Also, the sheet conductivity of the power plane can be obtained as a by-product. Experiments have been performed and the successful prediction of the exact short point validates the present inspection approach.<
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