On the Static Cross Section of SRAM-Based FPGAs

We present new experimental results about the sensitivity of SRAM-based FPGAs to heavy ions. We analyze the static cross section as a function of the FPGA resource type. We also study the soft error rate as function of the accumulated total dose, and investigate the occurrence of multiple bit upsets in the configuration memory. We provide radiation data using a Xilinx Spartan-3 FPGA as test vehicle.