Abstract:
We study the tight focusing properties of a novel polarization field with elliptical symmetry. The eccentricity of the incident field assists in controlling the focal fie...Show MoreMetadata
Abstract:
We study the tight focusing properties of a novel polarization field with elliptical symmetry. The eccentricity of the incident field assists in controlling the focal field properties, allowing matching the field distribution to specific applications.
Published in: 2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science
Date of Conference: 04-09 May 2008
Date Added to IEEE Xplore: 22 July 2008
Print ISBN:978-1-55752-859-9