Perpendicular Anisotropy in FeCr Sputtered Films

Magnetic thin films of Fe
1-x
Cr
x
(x = 0.33 to 0.40) with perpendicular magnetization were obtained using the rf sputtering method for the first time. Fe
66
Cr
34
deposited onto an unheated substrate had K
u
= 6 × 10
⁵
erg/cm
³
, M
s
= 280 emu/cm
³
and H
c
1 = 700 Oe. Film composition and substrate temperature during film preparation were the most important factors inducing perpendicular anisotropy. X-ray diffraction studies showed that the induction of perpendicular anisotropy was always accompanied by growth of the crystalline phase (Cr-dominant bcc phase). FeCr films also exhibited high corrosion resistivity in an oxidizing environment. FeCr is a candidate material for use in perpendicular magnetic recording.