Sample-induced beam distortions in terahertz time domain spectroscopy and imaging systems

It is demonstrated that distortion of the terahertz beam profile and generation of a cross-polarised component occur when the beam in terahertz time domain spectroscopy and imaging systems interacts with the sample under test. These distortions modify the detected signal, leading to spectral and image artefacts. The degree of distortion depends on the optical design of the system as well as the properties of the sample.