Proxels for Reliability Assessment of Future Nano-Architectures

As devices are scaled towards the infinitesimal, the occurrences of defects and failures will certainly increase. This is a statement that has been repeated on numerous occasions recently. Therefore, accurate evaluation of reliability should be considered-besides area, power, and delay-as one additional design parameter of future nano-circuits. The goal of this paper is to evaluate the applicability (for this particular task) of the recently developed proxel-based method. The paper will include a background on the proxel-based method, its customization for the particular task at hand, as well as experimental results regarding its applicability towards reliability evaluation of nano-circuits.