Capacitance computation of elliptic microstrip disks in biaxial anisotropic multilayered substrates

Variational techniques in the spectral domain are used to develop an algorithm which calculates a lower bound of the capacitance of a conductor elliptic disk embedded in a lossless multilayered substrate with arbitrary dielectric anisotropy. This algorithm is intended to be a useful tool for lumped-element design in monolithic microwave integrated circuit (MMIC) applications. The calculation method is shown to be general, quick, and accurate when implemented in a computer program. Numerical results to demonstrate the efficiency of the algorithm are given.<>