Performance of Reverse Electrode HPGE Coaxial Detectors after Light Damage by Fast Neutrons

Several reverse electrode HPGe coaxial detectors fast neutron-damaged to various fluences were annealed at room temperature for varying periods of time. For comparison, in one case a dry ice temperature anneal was made. The result of these annealings on the energy resolution at 1.33 MeV was measured. The effect of source intensity and energy on the energy resolution and line shape are discussed.