Permittivity Measurements at Microwave Frequencies Using Lumped Elements

A simple frequency-domain method for measurement of the dielectric properties of materials is described. Theoretical analysis of the frequency dependence of the reflection coefficient of a shunt lumped capacitor located at the end of a transmission line and filled with a very small amount of the dielectric (typically a few microliters) is given. Analysis and calculations of the overall uncertainty in permittivity measurements, as well as experimental results for some normal alcohols, are presented and limitation of the method discussed.