Impact of SOI History Effect on Random Data Signals

The impact of silicon-on-insulator (SOI) history effect in communication circuits containing delay chains is experimentally evaluated. In previous work, SOI history has been seen to change data pulse widths by 5% to 15% for fixed data patterns. In contrast, this work shows that data scrambling and DC balance reduce the effect to 1% or less, eliminating history effect as a concern for such communication circuits.