Optimal Excitation in Fault Diagnosis of Analog Electronic Circuits

this paper presents method of deriving optimal excitation signal maximizing probability of successful fault diagnosis. The approach uses evolutionary algorithm and wavelet analysis. The diagnosis procedure is conducted by means of specialized aperiodic excitation. Results are compared with fault diagnosis using unit step excitation. The method belongs to Simulation Before Test (SBT) class of fault diagnosis procedure and focuses on case where only input and output nodes of integrated circuit under test (CUT) are available.