Magneto-resistance, stress effects, and a self-similar expansion model for the magnetization process in amorphous wires

The outer shell magnetization process was investigated from the point of view of its effects on longitudinal and transverse magnetoresistance (MR), magnetization, and domain structure observations as well as their stress effects for a Fe/sub 77.5/Si/sub 7.5/B/sub 15/ amorphous wire with a diameter of 125 mu m prepared by rapid quenching in rotating water. The unusual behavior of the initial negative slope observed in the longitudinal MR is explained in terms of a realistic domain structure. A self-similar expansion model is proposed to explain the dynamical response of such a structure under applied fields and/or tensile stresses. It is suggested that the zig-zag domains of the outer shell are stabilized by a square closure domain which expands uniformly while maintaining a self-similar shape up to a threshold field of about 20 Oe and then deforms towards the saturation magnetization. However, this domain structure was destroyed or much deformed by a tensile stress along the wire axis of about 170 MPa in the sample. Such a critical stress depends on the diameter, quenching conditions, alloy composition, etc. This behavior and stabilization of the zig-zag domain by the closure domains give a novel mechanism for the magnetization processes which follow the re-entrant reversal, and are thus useful for the understanding of re-entrant reversal phenomena themselves.<
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