Low-Noise Crystalline Soft Underlayer for CoCrPt:SiO$_{2}$ Perpendicular Recording Media

In this paper, a crystalline soft underlayer with chemical formula (Fe
₁₅
Co
₈₅
)
₉₄
Cr
₃
Ta
₃
for CoCrPt:SiO
₂
-based perpendicular media is studied. Three kinds of approaches are used to successfully reduce the noise from the soft underlayer. X-ray diffraction is used to study the effect of the preparation parameters on the orientations of the soft underlayer and the recording layer. The mechanism for the noise reduction is discussed