A/D converter characterization by spectral analysis in "Dual-Tone" mode

Analog-to-digital (A/D) converter performances are constantly improving, concerning both conversion speed and resolution. Consequently, characterization becomes harder as the limits of the testing instrumentation are reached. We tried to answer that problem by defining a test methodology based on "dual-tone" spectral analysis. In this paper we present both the basic principles of this method and also experimental results on A/D converters.<
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