Extraction of Linear and Non-Linear MESFET Models

The non-linear parameter extraction technique proposed in this paper gives both rapid convergence and consistency of the derived model. The technique has been used for the purpose of modelling R.F. on wafer probed as well as packaged devices. A novel method has been developed for the modelling of dispersive MESFETs. The results of modelling an R.F. on wafer probed MESFET device are presented and very good agreements between measurements and calculations are obtained.