The High-Frequency Behaviour of Microstrip Open Ends in Microwave Integrated Circuits Including Energy Leakage

The complex dynamic behaviour of microstrip open ends in a microwave integrated circuit (MIC) environment, i.e. in the presence of a conducting cover, is analyzed rigorously and discussed under inclusion of energy leakage. Two different spectral domain formulations are used in conjunction with the residue calculus technique and give comparable results. The results described and several features of the analyses are new. Applications in the field of MIC computer aided design (CAD) and measurement (CAM) are outlined.