Synthetic TDR Measurements for TEM and GTEM Cell Characterization

This paper describes the main features of the time-domain reflectometry (TDR) measurement technique and, in particular, the TDR analysis performed using a proper operating mode of the vector network analyzer (VNA), which is called synthetic TDR. Furthermore, some results of reflection measurement, which aim to characterize the impedance behavior of transverse electromagnetic (TEM) and gigahertz TEM cells by means of a commercial VNA in time-domain mode, are presented