Study of Millimeter-Wave On-Wafer Calibration Techniques and Effect Upon HEMT Parameter Extraction

A new procedure has been developed to identify which calibration techniques are most suitable for millimeter-wave, on-wafer measurements. This work quantifies the sources and types of error encountered with SOLT and LRM calibrations in relation to multi-line TRL calibrations at V-band. A sensitivity analysis studies these calibration effects upon InP HEMT parameter extraction at V-Band.