An Automated Non-Linear Transistor Characterization System with a High-Level Language User-Interface for Easy Control, Visualization and Data Management

In this paper, a system for the extensive non-linear characterization of microwave transistors is presented. The high level language user interface for its automatic control and near real time visualization and management of the measured data is highlighted. Some descriptive pictures and experimental results are presented to illustrate the versatility of the system and the efficacy of the interfacing software.