A Tool for Advanced Learning of LFSR-Based Testing Principles

Linear feedback shift registers (LFSR) has become one of the central elements used in testing and self testing of contemporary complex electronic systems like processors, controllers, and high-performance integrated circuits. The current paper describes a training tool for learning basic and advanced issues related to LFSR-based pseudo-random test pattern generation. Unlike other similar systems, this tool facilitates study of various test optimization problems, allows fault coverage analysis for different circuits and with different LFSR parameters. The main didactic aim of the tool is in presenting complicated concepts in a comprehensive graphical way. The multi-platform JAVA runtime environment allows for easy access and usage of the tool both in a classroom and at home. The tool represents a simulation, training, and research environment that supports both analytic and synthetic way of learning