Notice of Violation of IEEE Publication Principles: Design Pattern Mining from Source Code for Reverse Engineering

Notice of Violation of IEEE Publication Principles

"Design Pattern Mining from Source Code for Reverse Engineering"
by N. Basu, S. Chatterjee and N. Chaki
in Proceedings of the IEEE Region 10 Conference (TENCON), November 2005

After careful and considered review of the content and authorship of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE’s Publication Principles.

This paper is a duplication of the original text from the paper cited below. The original text was copied without attribution (including appropriate references to the original author(s) and/or paper title) and without permission.

Due to the nature of this violation, reasonable effort should be made to remove all past references to this paper, and future references should be made to the following article:

"Mining Design Patterns from C++ Source Code"
by Zsolt Balanyi and Rudolf Ferenc
in Proceedings of the 19th International Conference on Software Management (ICSM) September 2003


Design patterns are micro architectures that have proved to be reliable, easy-to implement and robust. There is a need in science and industry for recognizing these patterns. This paper aims toward development of a new method for discovering design patterns in the source codes. The method provides a precise specification of how the patterns work by describing basic structural information like inheritance, composition, aggregation and association, and as an indispensable part, by defining call delegation, object creation and operation overriding. We have tried to introduce a new XML-based language, the extensible pattern markup language XPML, which provides an easy way for the users to modify pattern descriptions to suit their needs, or even to define their own patterns or just classes in certain relations they wish to find. The proposed method is tested on four open-source systems, and is found to be effective in discovering design pattern instances.