Radiation Hardness of Hardened-By-Design SRAMs in Commercial Foundry Technologies

Hardened-by-design (HBD) SRAMs are shown to be latchup immune in four commercial foundry technologies. The single-event error rates are shown to be less than 10
^-9
errors/bit/day for these HBD SRAMs. We also report total-dose and prompt-dose hardness results. Hardness assurance of HBD SRAMs in commercial processes is considered