Proton Radiation Test Results on COTS-Based Electronic Devices for NASA-Johnson Space Center Spaceflight Projects

This paper reports the results of recent single event effect (SEE) testing on a variety of commercial-off-the-shelf (COTS) based microelectronic hardware after exposure to 200 Mega-electron-volt (MeV) protons. This hardware was being evaluated for use in both Space Shuttle and International Space Station (ISS) applications. Our approach, test protocol and analysis methodology are discussed