An Area and Power Efficient Radiation Hardened by Design Flip-Flop

A radiation hardened by design flip-flop with high single event effect immunity is described. Circuit size and power are reduced by a combination of proven SEE hard techniques, i.e., a temporal latch master and DICE slave are used. Two shift register chains each comprised of 1920 flip-flops have been implemented in the IBM 0.13 mum bulk CMOS process. Measured SEE immunity in accelerated heavy ion testing, and power results are described. A threshold LET over 45 LET (MeV-cm
²
/mg) at V
_DD
=1.5 V is demonstrated. High layout density and the likely high LET failure mechanisms are described