Superconducting YBaCuO thin films on silicon with barium silicate buffer layers

The diffusion barrier capabilities of thin layers of barium silicate, which are determined by the interaction between the YBaCuO compound and Si substrate, have been investigated. Analysis of the films' elemental depth distributions show that their interaction with the substrates result in the formation of a Ba/sub 2/SiO/sub 4/ layer. The superconducting characteristic of YBaCuO films obtained on barium silicate, in terms of transition width and T/sub c0/, are significantly improved compared to those without buffering.<
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