LFSROM: Basic Principle and BIST application

A built-in self test (BIST) approach wherein the on-chip test pattern generator is basically the combination of a LFSR, on OR/sub 2/ network and a set of multiplexers is described. Given precomputed sequences of deterministic test vectors, it is illustrated by some examples that this LFSROM generator provides data storage performances comparable in quality to a ROM.<
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