Extension of digital test system data rates to the gigabit per second range

A high frequency system and methodology are presented for the generation and capture of gigabit per second digital data. The approach extends the useful data rate of existing test systems by multiplexing channels, thereby allowing a trade-off between data rate and signal count. This capability facilitates the test of advanced bipolar emitter-coupled-logic (ECL) and GaAs digital devices using commercially available instrumentation. As an example, a GaAs-based data rate extender module is introduced which provides an interface between Gbps-range devices and a 200 Mbps host test system.<
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