Current and future thrusts in automated RF and microwave testing

Development of generic test algorithms for broadband RF and microwave components can be challenging due to the wide variances in device properties. Test assumptions, which are suitable for devices with tightly constrained setup and operating ranges, tend to break down when generalized to the broader population of microwave devices. These difficulties are compounded when dealing with high power components, such as traveling wave tubes. The key to design of truly general-purpose algorithms is to minimize or eliminate the constraining assumptions used to simplify test code. At the same time, extreme care must be taken to protect high-cost components from damage during setup and test. Automated test algorithms must achieve closure even when assumptions concerning normal device behavior break down. In this paper, we discuss our current work, and future initiatives for such robust algorithm design.<
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