Measurement-based model parameters for quasi-optical electron device arrays

Impedance element values for a Schottky beam control diode array are obtained by curve-fitting quasioptical reflection coefficient measurements to a series RLC array model. The model provides a good representation of the array behavior. Parameters of Schottky varactor arrays tested to-date are summarized. The technique should be applicable to other quasioptical arrays, as well.<
>