An algorithm for locating short circuits among N signal paths using K-port parallel short detector

To locate short circuits on a printed circuit board, a K-port parallel short detector can test K signal paths simultaneously. If the total number of signal paths N on a printed circuit board is larger than K, then we need to divide the testing process into multiple stages such that at most R signal paths are tested in each stage. In this paper, we design a parallel algorithm to locate all the short circuits among the N signal paths on a printed circuit board using a K-port parallel short detector where K>