Measurements of low loss dielectric materials in the 60 GHz band using a high-Q Gaussian beam open resonator

For the determination of the dielectric properties of low-loss materials in the 60 GHz band, this paper describes a full confocal Gaussian beam open resonator. The resonator is coupled with a HP 8510C vector network analyzer and the latter is computer controlled for automatic measurements. The data are processed using the open resonator scalar theory and the frequency variation method. Results on 96% alumina samples with thickness varying from 0.5 mm to 1 mm, are presented in the V band.<>