A MOS implementation of totally self-checking checker for the 1-out-of-3 code

The problem of designing a totally self-checking (TSC) checker for the 1-out-of-3 code using combinational logic alone has not yet been solved. it is shown, however, that it is feasible to design such a checker in MOS technology. Analysis and simulation show that the proposed checker is a TSC checker for the 1-out-of-3 code with respect to a set of physical defects which occur frequently in MOS technology.<
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