High-resolution measurement of birefringence profiles in stress-induced polarization-maintaining fibers

A novel technique for measuring the local refractive-index anisotropy in stress-induced polarization-maintaining fibers is presented. This technique is an extension of the well-known refracted near-field method for high-resolution measurement of refractive-index profiles. The application of this technique to two different types of fiber reveals birefringence profiles as well as differential stress profiles. Calculated birefringent profiles determined by means of a finite-element method are in good agreement with measured ones. Interferometrically measured modal birefringence verified corresponding data obtained from birefringence profiles.<
>