SEU tests with an improved Cf-252 system

An improved Cf-252 single event upset (SEU) testing system is described. The improved system has a greater range of linear energy transfer (LETs) and has a rotating platform that can test devices at different angles with respect to the beam of fission fragments. The quality of the fission fragment detector is also improved. Better SEU results of a 2k/spl times/8 SRAM have been obtained and confirmed those obtained with an accelerator.<
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