Internal thermal resistance of a multi-chip packaging design for VLSI based systems

A heat-transfer study is conducted for the steady-state internal thermal resistance of a multichip packaging technology for VLSI-based systems. This technology, which is known as advanced VLSI packaging (AVP), has chips flip-chip soldered and interconnected on a silicon substrate. AVP's thermal management approach is to dissipate chip power through the silicon substrate to a heat sink or other packaging levels. The authors found a need to control the chip-to-substrate interface; therefore, they use a three-dimensional heat conduction analysis to characterize this interface. They simulate thermal performance of typical AVP assemblies affected by thermal vias, solder bump heights, high-power I O drivers, and chip sizes. The authors also analyze and measure the internal resistances of an experimental package consisting of three WE32100 chips. These resistances are predicted as 3.7, 4.7, and 5.0 degrees C/W, respectively; they are confirmed by the experimental data. The authors demonstrate the low thermal resistance achieved: 3.0 degrees C/W for a 1-cm square chip and 10 degrees C/W for a 0.25-cm square chip. They also provide their insight into the roles of different conduction paths involved.<
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