Potential buildup in samples charged by successive low-energy pulses

We present a calculation for the charging of a dielectric sample submitted in open circuit to a series of consecutive, identical, electron pulses of low energy. The calculation is based on deep trap kinematics and takes full account of space charge effects. Electric field profiles and the potential buildup after n/spl les/10 pulses are presented, allowing one to infer the important parameter /spl mu//spl tau/ of the material (/spl mu/ the mobility and /spl tau/ the trapping time). A comparison with the results of a simple calculation which neglects space charge effects is also given.<
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